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	<title>WEBREVIEW</title>
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	<description>Webreview est un site f&#233;d&#233;rateur des revues scientifiques. Il met &#224; la disposition des utilisateurs un ensemble de revues scientifiques alg&#233;riennes couvrant tous les domaines. Webreview est ouvert &#224; toute revue d&#233;sireuse de publier son contenu en ligne soit en mode d'acc&#232;s complet ou restreint permettant ainsi la valorisation de la recherche scientifique en Alg&#233;rie. Webreview et un projet d&#233;velopp&#233; par le CERIST au sein de la Division Recherche et D&#233;veloppement en Sciences de l'Information. Pour contacter Webreview par &#233;mail : webreview@mail.cerist.dz Pour contacter Webreview par courrier, fax ou t&#233;l&#233;phone : Centre de Recherche sur l'Information Scientifique et Technique (CERIST) Rue des 03 fr&#232;res AISSOU, Ben-Aknoun, Alger, Alg&#233;rie T&#233;l/Fax : +(213)(0) 21.91.21.98</description>
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		<title>A new drain current I&#8211;V model for MESFET with submicron gate</title>
		<link>http://www.webreview.dz/spip.php?article2376</link>
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		<dc:date>2015-03-10T13:37:51Z</dc:date>
		<dc:format>text/html</dc:format>
		<dc:language>fr</dc:language>
		<dc:creator>Azizi C., Azizi M.</dc:creator>


		<dc:subject>MESFET</dc:subject>
		<dc:subject>GaAs</dc:subject>
		<dc:subject>nonlinear models</dc:subject>
		<dc:subject>interface states</dc:subject>
		<dc:subject>submicron gate</dc:subject>

		<description>
&lt;p&gt;In this work we present a new nonlinear approach for the calculation of the static characteristics of MESFET GaAs with submicron gate. First, we compare the results of the numerical simulations of the three main models for the MESFETs with submicron gate : Ahmed [1], Islam [2] and Memon [3] with experimental results. Then we propose a new approach that takes into account the surface states of the Schottky junction through a new mobility law for the determination of the output (...)&lt;/p&gt;


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&lt;a href="http://www.webreview.dz/spip.php?rubrique411" rel="directory"&gt;Num&#233;ro 01&lt;/a&gt;

/ 
&lt;a href="http://www.webreview.dz/spip.php?mot8271" rel="tag"&gt;MESFET&lt;/a&gt;, 
&lt;a href="http://www.webreview.dz/spip.php?mot8967" rel="tag"&gt;GaAs&lt;/a&gt;, 
&lt;a href="http://www.webreview.dz/spip.php?mot8968" rel="tag"&gt;nonlinear models&lt;/a&gt;, 
&lt;a href="http://www.webreview.dz/spip.php?mot8969" rel="tag"&gt;interface states&lt;/a&gt;, 
&lt;a href="http://www.webreview.dz/spip.php?mot8970" rel="tag"&gt;submicron gate&lt;/a&gt;

		</description>


 <content:encoded>&lt;div class='rss_chapo'&gt;&lt;p&gt;In this work we present a new nonlinear approach for the calculation of the static characteristics of MESFET GaAs with submicron gate. First, we compare the results of the numerical simulations of the three main models for the MESFETs with submicron gate : Ahmed [1], Islam [2] and Memon [3] with experimental results. Then we propose a new approach that takes into account the surface states of the Schottky junction through a new mobility law for the determination of the output characteristics. The thermal effect is also represented in the mobility law. The comparison of our model with the three previous models referring to the experimental data shows that our approach gives the most accuracy result. Also, the proposed model can be used in the case of logic or analog circuits based on submicron GaAs MESFET.&lt;/p&gt;&lt;/div&gt;
		
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<item xml:lang="fr">
		<title>A comprehensive nonlinear model for GaAs MESFET transistor</title>
		<link>http://www.webreview.dz/spip.php?article2184</link>
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		<dc:date>2015-02-24T10:17:34Z</dc:date>
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		<dc:language>fr</dc:language>
		<dc:creator>Azizi C., Azizi M., Kaddour C., Mellal S., Zaabat M., Ziar T.</dc:creator>


		<dc:subject>MESFET- GaAs</dc:subject>
		<dc:subject>Submicrom nonlinear model</dc:subject>
		<dc:subject>comparative study</dc:subject>

		<description>
&lt;p&gt;An analytical two-dimensional (2D) model to accurately predict the channel potential and electric field distribution in sub-micron GaAs MESFET based on (2D) analytical solution of Poisson's equation using superposition principle is presented. The results so obtained for current voltage characteristics, Transconductance and drain conductance, are presented and validated against both experimental I-V curves and various Models of the submicron MESFET GaAs. The model is then extended to predict (...)&lt;/p&gt;


-
&lt;a href="http://www.webreview.dz/spip.php?rubrique411" rel="directory"&gt;Num&#233;ro 01&lt;/a&gt;

/ 
&lt;a href="http://www.webreview.dz/spip.php?mot8474" rel="tag"&gt;MESFET- GaAs&lt;/a&gt;, 
&lt;a href="http://www.webreview.dz/spip.php?mot8475" rel="tag"&gt;Submicrom nonlinear model&lt;/a&gt;, 
&lt;a href="http://www.webreview.dz/spip.php?mot8476" rel="tag"&gt;comparative study&lt;/a&gt;

		</description>


 <content:encoded>&lt;div class='rss_chapo'&gt;&lt;p&gt;An analytical two-dimensional (2D) model to accurately predict the channel potential and electric field distribution in sub-micron GaAs MESFET based on (2D) analytical solution of Poisson's equation using superposition principle is presented. The results so obtained for current voltage characteristics, Transconductance and drain conductance, are presented and validated against both experimental I-V curves and various Models of the submicron MESFET GaAs. The model is then extended to predict the effects of parasitic resistances Rs and Rd, carriers mobility according to the electric fields and the edges effects on the performance. This model will allow more significant simulation of the component characteristics, with a precision improved for various conditions of Schottky barrier.&lt;/p&gt;&lt;/div&gt;
		
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