http://www.webreview.dz/ Webreview est un site fédérateur des revues scientifiques. Il met à la disposition des utilisateurs un ensemble de revues scientifiques algériennes couvrant tous les domaines. Webreview est ouvert à toute revue désireuse de publier son contenu en ligne soit en mode d'accès complet ou restreint permettant ainsi la valorisation de la recherche scientifique en Algérie. Webreview et un projet développé par le CERIST au sein de la Division Recherche et Développement en Sciences de l'Information. Pour contacter Webreview par émail : webreview@mail.cerist.dz Pour contacter Webreview par courrier, fax ou téléphone : Centre de Recherche sur l'Information Scientifique et Technique (CERIST) Rue des 03 frères AISSOU, Ben-Aknoun, Alger, Algérie Tél/Fax : +(213)(0) 21.91.21.98 fr SPIP - www.spip.net http://www.webreview.dz/spip.php?article2489 http://www.webreview.dz/spip.php?article2489 2015-05-20T12:34:42Z text/html fr Benbrahim N., Bouanik S., Guittoum A., Hadjersi T. , Lamrani S., Mebarki M. Structure Silicon nanowires NiFe alloy magnetic properties <p>Perpendicular Silicon nanowires (SiNWs), having 20 micrometer in length, were fabricated by metal assisted chemical etching of n-type Si(100) wafers in aqueous HF-solution. In a second step, NiFe films were electrodeposited onto theses SiNWs. The structure and magnetic properties of as deposited NiFe layers were studied by X ray diffraction (XRD) and vibrating sample magnetometer (VSM). From X-ray diffraction, the FCC NiFe structure was evidenced with a lattice constant, a, equal to 3.5270 (...)</p> - <a href="http://www.webreview.dz/spip.php?rubrique386" rel="directory">Numéro 01</a> / <a href="http://www.webreview.dz/spip.php?mot5040" rel="tag">Structure</a>, <a href="http://www.webreview.dz/spip.php?mot9281" rel="tag">Silicon nanowires</a>, <a href="http://www.webreview.dz/spip.php?mot9308" rel="tag">NiFe alloy</a>, <a href="http://www.webreview.dz/spip.php?mot9309" rel="tag">magnetic properties</a> <div class='rss_chapo'><p>Perpendicular Silicon nanowires (SiNWs), having 20 micrometer in length, were fabricated by metal assisted chemical etching of n-type Si(100) wafers in aqueous HF-solution. In a second step, NiFe films were electrodeposited onto theses SiNWs. The structure and magnetic properties of as deposited NiFe layers were studied by X ray diffraction (XRD) and vibrating sample magnetometer (VSM). From X-ray diffraction, the FCC NiFe structure was evidenced with a lattice constant, a, equal to 3.5270 Å. From hysteresis curves, we compute the coercive field, Hc, values. We found that the Hc // values range from 102 Oe to 236 Oe.</p></div>