http://www.webreview.dz/ Webreview est un site fédérateur des revues scientifiques. Il met à la disposition des utilisateurs un ensemble de revues scientifiques algériennes couvrant tous les domaines. Webreview est ouvert à toute revue désireuse de publier son contenu en ligne soit en mode d'accès complet ou restreint permettant ainsi la valorisation de la recherche scientifique en Algérie. Webreview et un projet développé par le CERIST au sein de la Division Recherche et Développement en Sciences de l'Information. Pour contacter Webreview par émail : webreview@mail.cerist.dz Pour contacter Webreview par courrier, fax ou téléphone : Centre de Recherche sur l'Information Scientifique et Technique (CERIST) Rue des 03 frères AISSOU, Ben-Aknoun, Alger, Algérie Tél/Fax : +(213)(0) 21.91.21.98 fr SPIP - www.spip.net http://www.webreview.dz/spip.php?article2857 http://www.webreview.dz/spip.php?article2857 2015-12-16T10:25:24Z text/html fr Bazer-Bachi B., Blanc D., Kaminski A. , Lemiti M., Nouiri A., Sayad Y. Solar cells Diffusion length LBIC crystalline silicon extended defects surface passivation <p>Light or Laser beam induced current technique (LBIC) is conventionally used to measure minority charge carrier's diffusion<br class='autobr' /> length LD by scanning a light spot away from collector (abrupt pn junction or Schottky contact). We show here the necessary<br class='autobr' /> precautions to be taken in order to apply this method on materials used in photovoltaics. We talk about SRLBIC or spectral<br class='autobr' /> response LBIC when this technique is combined with spectral reflectivity to allow determination of cells quantum (...)</p> - <a href="http://www.webreview.dz/spip.php?rubrique483" rel="directory">Numero 00</a> / <a href="http://www.webreview.dz/spip.php?mot7882" rel="tag">Solar cells</a>, <a href="http://www.webreview.dz/spip.php?mot8922" rel="tag">Diffusion length</a>, <a href="http://www.webreview.dz/spip.php?mot10340" rel="tag">LBIC</a>, <a href="http://www.webreview.dz/spip.php?mot10341" rel="tag">crystalline silicon</a>, <a href="http://www.webreview.dz/spip.php?mot10342" rel="tag">extended defects</a>, <a href="http://www.webreview.dz/spip.php?mot10343" rel="tag">surface passivation</a> <div class='rss_chapo'><p>Light or Laser beam induced current technique (LBIC) is conventionally used to measure minority charge carrier's diffusion<br class='autobr' /> length LD by scanning a light spot away from collector (abrupt pn junction or Schottky contact). We show here the necessary<br class='autobr' /> precautions to be taken in order to apply this method on materials used in photovoltaics. We talk about SRLBIC or spectral<br class='autobr' /> response LBIC when this technique is combined with spectral reflectivity to allow determination of cells quantum efficiency.<br class='autobr' /> From internal quantum efficiency analysis, one deduces an effective carrier diffusion length, Leff, including bulk and surface<br class='autobr' /> recombinations. LBIC is, also, often used to reveal electrically active extended defects such as grain boundaries and dislocations,<br class='autobr' /> and to check passivation efficiency of fabricated cells.</p></div>